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bsp/lpc176x: Remove blunt OPERATION_COUNT define

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BSP-specific test customization needs a more sophisticated approach.

Close #3352.
This commit is contained in:
Sebastian Huber
2018-03-21 07:15:22 +01:00
parent e40c5896bd
commit 26623e37fd
1 changed files with 0 additions and 3 deletions
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bsps/arm/lpc176x/include/bsp.h
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@@ -38,9 +38,6 @@
#include <rtems.h> #include <rtems.h>
#include <bsp/default-initial-extension.h> #include <bsp/default-initial-extension.h>
/** Define operation count for Tests */
#define OPERATION_COUNT 4
#ifdef __cplusplus #ifdef __cplusplus
extern "C" { extern "C" {
#endif /* __cplusplus */ #endif /* __cplusplus */