From 26623e37fd9051ef17c029fb115988c9959c814c Mon Sep 17 00:00:00 2001
From: Sebastian Huber <sebastian.huber@embedded-brains.de>
Date: Wed, 21 Mar 2018 07:15:22 +0100
Subject: [PATCH] bsp/lpc176x: Remove blunt OPERATION_COUNT define

BSP-specific test customization needs a more sophisticated approach.

Close #3352.
---
 bsps/arm/lpc176x/include/bsp.h | 3 ---
 1 file changed, 3 deletions(-)

diff --git a/bsps/arm/lpc176x/include/bsp.h b/bsps/arm/lpc176x/include/bsp.h
index e81e1cd53c..14c55f4194 100644
--- a/bsps/arm/lpc176x/include/bsp.h
+++ b/bsps/arm/lpc176x/include/bsp.h
@@ -38,9 +38,6 @@
 #include <rtems.h>
 #include <bsp/default-initial-extension.h>
 
-/** Define operation count for Tests */
-#define OPERATION_COUNT 4
-
 #ifdef __cplusplus
 extern "C" {
 #endif /* __cplusplus */