2007-03-10 Joel Sherrill <joel@OARcorp.com>

PR 1227/bsps
	* include/bsp.h: Remove MAX_LONG_TEST_DURATION and
	MAX_SHORT_TEST_DURATION. They are obsolete and unused.
This commit is contained in:
Joel Sherrill
2007-03-10 15:53:53 +00:00
parent 9f59157783
commit 5d3d6d1a20
24 changed files with 72 additions and 133 deletions

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@@ -1,3 +1,9 @@
2007-03-10 Joel Sherrill <joel@OARcorp.com>
PR 1227/bsps
* include/bsp.h: Remove MAX_LONG_TEST_DURATION and
MAX_SHORT_TEST_DURATION. They are obsolete and unused.
2007-01-26 Ralf Corsépius <ralf.corsepius@rtems.org>
* Makefile.am: Use MKDIR_P instead of mkdir_p.

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@@ -36,17 +36,6 @@ extern "C" {
/* #define CONFIGURE_NUMBER_OF_TERMIOS_PORTS 2 */
#define CONFIGURE_INTERRUPT_STACK_MEMORY (12 * 1024)
/*
* Define the time limits for RTEMS Test Suite test durations.
* Long test and short test duration limits are provided. These
* values are in seconds and need to be converted to ticks for the
* application.
*
*/
#define MAX_LONG_TEST_DURATION 300 /* 5 minutes = 300 seconds */
#define MAX_SHORT_TEST_DURATION 3 /* 3 seconds */
/*
* Simple spin delay in microsecond units for device drivers.
* This is very dependent on the clock speed of the target.

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@@ -1,3 +1,9 @@
2007-03-10 Joel Sherrill <joel@OARcorp.com>
PR 1227/bsps
* include/bsp.h: Remove MAX_LONG_TEST_DURATION and
MAX_SHORT_TEST_DURATION. They are obsolete and unused.
2006-12-15 Ralf Corsépius <ralf.corsepius@rtems.org>
* network/network.c: Use ioctl_command_t as arg in ioctl-functions.

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@@ -33,17 +33,6 @@ extern int rtems_fec_driver_attach (struct rtems_bsdnet_ifconfig *config, int at
/* define which port the console should use - all other ports are then defined as general purpose */
#define CONSOLE_PORT 0
/*
* Define the time limits for RTEMS Test Suite test durations.
* Long test and short test duration limits are provided. These
* values are in seconds and need to be converted to ticks for the
* application.
*
*/
#define MAX_LONG_TEST_DURATION 300 /* 5 minutes = 300 seconds */
#define MAX_SHORT_TEST_DURATION 3 /* 3 seconds */
/* externals */
/* constants */

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@@ -1,3 +1,9 @@
2007-03-10 Joel Sherrill <joel@OARcorp.com>
PR 1227/bsps
* include/bsp.h: Remove MAX_LONG_TEST_DURATION and
MAX_SHORT_TEST_DURATION. They are obsolete and unused.
2006-12-02 Ralf Corsépius <ralf.corsepius@rtems.org>
* configure.ac: New BUG-REPORT address.

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@@ -130,17 +130,6 @@ extern int rtems_enet_driver_attach (struct rtems_bsdnet_ifconfig *config);
/* System frequency */
#define BSP_SYSTEM_FREQUENCY (66 * 1000 * 1000)
/*
* Define the time limits for RTEMS Test Suite test durations.
* Long test and short test duration limits are provided. These
* values are in seconds and need to be converted to ticks for the
* application.
*
*/
#define MAX_LONG_TEST_DURATION 300 /* 5 minutes = 300 seconds */
#define MAX_SHORT_TEST_DURATION 3 /* 3 seconds */
/*
* Simple spin delay in microsecond units for device drivers.
* This is very dependent on the clock speed of the target.

View File

@@ -1,3 +1,9 @@
2007-03-10 Joel Sherrill <joel@OARcorp.com>
PR 1227/bsps
* include/bsp.h: Remove MAX_LONG_TEST_DURATION and
MAX_SHORT_TEST_DURATION. They are obsolete and unused.
2006-12-15 Ralf Corsépius <ralf.corsepius@rtems.org>
* network/network.c: Use ioctl_command_t as arg in ioctl-functions.

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@@ -33,17 +33,6 @@ extern int rtems_fec_driver_attach (struct rtems_bsdnet_ifconfig *config, int at
/* define which port the console should use - all other ports are then defined as general purpose */
#define CONSOLE_PORT 0
/*
* Define the time limits for RTEMS Test Suite test durations.
* Long test and short test duration limits are provided. These
* values are in seconds and need to be converted to ticks for the
* application.
*
*/
#define MAX_LONG_TEST_DURATION 300 /* 5 minutes = 300 seconds */
#define MAX_SHORT_TEST_DURATION 3 /* 3 seconds */
/* externals */
/* constants */

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@@ -1,3 +1,9 @@
2007-03-10 Joel Sherrill <joel@OARcorp.com>
PR 1227/bsps
* include/bsp.h: Remove MAX_LONG_TEST_DURATION and
MAX_SHORT_TEST_DURATION. They are obsolete and unused.
2006-12-14 Till Straumann <strauman@slac.stanford.edu>
* startup/bspstart.c: Changed BSP_installVME_isr() so that

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@@ -50,17 +50,6 @@ extern int rtems_fec_driver_attach (struct rtems_bsdnet_ifconfig *config, int at
/* define which port the console should use - all other ports are then defined as general purpose */
#define CONSOLE_PORT 0
/*
* Define the time limits for RTEMS Test Suite test durations.
* Long test and short test duration limits are provided. These
* values are in seconds and need to be converted to ticks for the
* application.
*
*/
#define MAX_LONG_TEST_DURATION 300 /* 5 minutes = 300 seconds */
#define MAX_SHORT_TEST_DURATION 3 /* 3 seconds */
/* externals */
/* constants */

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@@ -1,3 +1,9 @@
2007-03-10 Joel Sherrill <joel@OARcorp.com>
PR 1227/bsps
* include/bsp.h: Remove MAX_LONG_TEST_DURATION and
MAX_SHORT_TEST_DURATION. They are obsolete and unused.
2006-12-02 Ralf Corsépius <ralf.corsepius@rtems.org>
* configure.ac: New BUG-REPORT address.

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@@ -28,17 +28,6 @@ extern "C" {
#include <rtems/clockdrv.h>
#include <libcpu/au1x00.h>
/*
* Define the time limits for RTEMS Test Suite test durations.
* Long test and short test duration limits are provided. These
* values are in seconds and need to be converted to ticks for the
* application.
*
*/
#define MAX_LONG_TEST_DURATION 300 /* 5 minutes = 300 seconds */
#define MAX_SHORT_TEST_DURATION 3 /* 3 seconds */
/*
* Define the interrupt mechanism for Time Test 27
*/

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@@ -1,3 +1,9 @@
2007-03-10 Joel Sherrill <joel@OARcorp.com>
PR 1227/bsps
* include/bsp.h: Remove MAX_LONG_TEST_DURATION and
MAX_SHORT_TEST_DURATION. They are obsolete and unused.
2006-12-12 Ralf Corsépius <ralf.corsepius@rtems.org>
* include/bsp.h: Use uint32_t instead of unsigned32.

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@@ -40,17 +40,6 @@ extern "C" {
extern void WriteDisplay( char * string );
/*
* Define the time limits for RTEMS Test Suite test durations.
* Long test and short test duration limits are provided. These
* values are in seconds and need to be converted to ticks for the
* application.
*
*/
#define MAX_LONG_TEST_DURATION 300 /* 5 minutes = 300 seconds */
#define MAX_SHORT_TEST_DURATION 3 /* 3 seconds */
/*
* Stuff for Time Test 27
*/

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@@ -1,3 +1,9 @@
2007-03-10 Joel Sherrill <joel@OARcorp.com>
PR 1227/bsps
* include/bsp.h: Remove MAX_LONG_TEST_DURATION and
MAX_SHORT_TEST_DURATION. They are obsolete and unused.
2006-12-02 Ralf Corsépius <ralf.corsepius@rtems.org>
* configure.ac: New BUG-REPORT address.

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@@ -27,17 +27,6 @@ extern "C" {
#include <rtems/clockdrv.h>
#include <libcpu/tx4925.h>
/*
* Define the time limits for RTEMS Test Suite test durations.
* Long test and short test duration limits are provided. These
* values are in seconds and need to be converted to ticks for the
* application.
*
*/
#define MAX_LONG_TEST_DURATION 300 /* 5 minutes = 300 seconds */
#define MAX_SHORT_TEST_DURATION 3 /* 3 seconds */
/*
* Define the interrupt mechanism for Time Test 27
*

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@@ -1,3 +1,9 @@
2007-03-10 Joel Sherrill <joel@OARcorp.com>
PR 1227/bsps
* include/bsp.h: Remove MAX_LONG_TEST_DURATION and
MAX_SHORT_TEST_DURATION. They are obsolete and unused.
2006-12-02 Ralf Corsépius <ralf.corsepius@rtems.org>
* configure.ac: New BUG-REPORT address.

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@@ -27,17 +27,6 @@ extern "C" {
#include <rtems/clockdrv.h>
#include <libcpu/tx4938.h>
/*
* Define the time limits for RTEMS Test Suite test durations.
* Long test and short test duration limits are provided. These
* values are in seconds and need to be converted to ticks for the
* application.
*
*/
#define MAX_LONG_TEST_DURATION 300 /* 5 minutes = 300 seconds */
#define MAX_SHORT_TEST_DURATION 3 /* 3 seconds */
/*
* Define the interrupt mechanism for Time Test 27
*

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@@ -1,3 +1,9 @@
2007-03-10 Joel Sherrill <joel@OARcorp.com>
PR 1227/bsps
* include/bsp.h: Remove MAX_LONG_TEST_DURATION and
MAX_SHORT_TEST_DURATION. They are obsolete and unused.
2007-01-23 Thomas Doerfler <Thomas.Doerfler@embedded-brains.de>
* console/console.c: corrected typo in UART error handler (usage

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@@ -136,17 +136,6 @@ extern rtems_configuration_table BSP_Configuration;
#define NOCACHE_MEM_SIZE 512*1024
*/
/*
* Define the time limits for RTEMS Test Suite test durations.
* Long test and short test duration limits are provided. These
* values are in seconds and need to be converted to ticks for the
* application.
*
*/
#define MAX_LONG_TEST_DURATION 300 /* 5 minutes = 300 seconds */
#define MAX_SHORT_TEST_DURATION 3 /* 3 seconds */
/*
* Stuff for Time Test 27
*/

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@@ -1,3 +1,9 @@
2007-03-10 Joel Sherrill <joel@OARcorp.com>
PR 1227/bsps
* include/bsp.h: Remove MAX_LONG_TEST_DURATION and
MAX_SHORT_TEST_DURATION. They are obsolete and unused.
2006-12-12 Ralf Corsépius <ralf.corsepius@rtems.org>
* console/console.c, timer/timer.c: Use uint32_t instead of

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@@ -53,17 +53,6 @@ extern int rtems_smc91111_driver_attach_leon2(struct rtems_bsdnet_ifconfig *conf
#define RTEMS_BSP_NETWORK_DRIVER_ATTACH_OPENETH rtems_leon_open_eth_driver_attach
#define RTEMS_BSP_NETWORK_DRIVER_ATTACH_SMC91111 rtems_smc91111_driver_attach_leon2
/*
* Define the time limits for RTEMS Test Suite test durations.
* Long test and short test duration limits are provided. These
* values are in seconds and need to be converted to ticks for the
* application.
*
*/
#define MAX_LONG_TEST_DURATION 3 /* 3 seconds */
#define MAX_SHORT_TEST_DURATION 3 /* 3 seconds */
/*
* The synchronous trap is an arbitrarily chosen software trap.
*/

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@@ -1,3 +1,9 @@
2007-03-10 Joel Sherrill <joel@OARcorp.com>
PR 1227/bsps
* include/bsp.h: Remove MAX_LONG_TEST_DURATION and
MAX_SHORT_TEST_DURATION. They are obsolete and unused.
2007-02-09 Ralf Corsépius <ralf.corsepius@rtems.org>
* shmsupp/getcfg.c: Comment out npu (Unused).

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@@ -77,18 +77,6 @@ extern int rtems_leon_greth_driver_attach(
#define RTEMS_BSP_NETWORK_DRIVER_ATTACH RTEMS_BSP_NETWORK_DRIVER_ATTACH_GRETH
#endif
/*
* Define the time limits for RTEMS Test Suite test durations.
* Long test and short test duration limits are provided. These
* values are in seconds and need to be converted to ticks for the
* application.
*
*/
#define MAX_LONG_TEST_DURATION 3 /* 3 seconds */
#define MAX_SHORT_TEST_DURATION 3 /* 3 seconds */
/*
* Simple spin delay in microsecond units for device drivers.
* This is very dependent on the clock speed of the target.