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2007-03-10 Joel Sherrill <joel@OARcorp.com>

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PR 1227/bsps
	* include/bsp.h: Remove MAX_LONG_TEST_DURATION and
	MAX_SHORT_TEST_DURATION. They are obsolete and unused.
This commit is contained in:
Joel Sherrill
2007-03-10 15:53:53 +00:00
parent 9f59157783
commit 5d3d6d1a20
24 changed files with 72 additions and 133 deletions
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6
c/src/lib/libbsp/sparc/leon2/ChangeLog
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@@ -1,3 +1,9 @@
2007-03-10 Joel Sherrill <joel@OARcorp.com>
PR 1227/bsps
* include/bsp.h: Remove MAX_LONG_TEST_DURATION and
MAX_SHORT_TEST_DURATION. They are obsolete and unused.
2006-12-12 Ralf Corsépius <ralf.corsepius@rtems.org>
* console/console.c, timer/timer.c: Use uint32_t instead of

11
c/src/lib/libbsp/sparc/leon2/include/bsp.h
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@@ -53,17 +53,6 @@ extern int rtems_smc91111_driver_attach_leon2(struct rtems_bsdnet_ifconfig *conf
#define RTEMS_BSP_NETWORK_DRIVER_ATTACH_OPENETH rtems_leon_open_eth_driver_attach
#define RTEMS_BSP_NETWORK_DRIVER_ATTACH_SMC91111 rtems_smc91111_driver_attach_leon2
/*
* Define the time limits for RTEMS Test Suite test durations.
* Long test and short test duration limits are provided. These
* values are in seconds and need to be converted to ticks for the
* application.
*
*/
#define MAX_LONG_TEST_DURATION 3 /* 3 seconds */
#define MAX_SHORT_TEST_DURATION 3 /* 3 seconds */
/*
* The synchronous trap is an arbitrarily chosen software trap.
*/

6
c/src/lib/libbsp/sparc/leon3/ChangeLog
View File

@@ -1,3 +1,9 @@
2007-03-10 Joel Sherrill <joel@OARcorp.com>
PR 1227/bsps
* include/bsp.h: Remove MAX_LONG_TEST_DURATION and
MAX_SHORT_TEST_DURATION. They are obsolete and unused.
2007-02-09 Ralf Corsépius <ralf.corsepius@rtems.org>
* shmsupp/getcfg.c: Comment out npu (Unused).

12
c/src/lib/libbsp/sparc/leon3/include/bsp.h
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@@ -77,18 +77,6 @@ extern int rtems_leon_greth_driver_attach(
#define RTEMS_BSP_NETWORK_DRIVER_ATTACH RTEMS_BSP_NETWORK_DRIVER_ATTACH_GRETH
#endif
/*
* Define the time limits for RTEMS Test Suite test durations.
* Long test and short test duration limits are provided. These
* values are in seconds and need to be converted to ticks for the
* application.
*
*/
#define MAX_LONG_TEST_DURATION 3 /* 3 seconds */
#define MAX_SHORT_TEST_DURATION 3 /* 3 seconds */
/*
* Simple spin delay in microsecond units for device drivers.
* This is very dependent on the clock speed of the target.