forked from Imagelibrary/rtems
2007-03-10 Joel Sherrill <joel@OARcorp.com>
PR 1227/bsps * include/bsp.h: Remove MAX_LONG_TEST_DURATION and MAX_SHORT_TEST_DURATION. They are obsolete and unused.
This commit is contained in:
@@ -1,3 +1,9 @@
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2007-03-10 Joel Sherrill <joel@OARcorp.com>
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PR 1227/bsps
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* include/bsp.h: Remove MAX_LONG_TEST_DURATION and
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MAX_SHORT_TEST_DURATION. They are obsolete and unused.
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2007-02-22 Ralf Corsépius <ralf.corsepius@rtems.org>
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2007-02-22 Ralf Corsépius <ralf.corsepius@rtems.org>
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* Makefile.am: Use MKDIR_P instead of mkdir_p.
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* Makefile.am: Use MKDIR_P instead of mkdir_p.
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@@ -36,17 +36,6 @@ extern "C" {
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/* #define CONFIGURE_NUMBER_OF_TERMIOS_PORTS 2 */
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/* #define CONFIGURE_NUMBER_OF_TERMIOS_PORTS 2 */
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#define CONFIGURE_INTERRUPT_STACK_MEMORY (12 * 1024)
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#define CONFIGURE_INTERRUPT_STACK_MEMORY (12 * 1024)
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/*
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* Define the time limits for RTEMS Test Suite test durations.
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* Long test and short test duration limits are provided. These
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* values are in seconds and need to be converted to ticks for the
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* application.
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*
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*/
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#define MAX_LONG_TEST_DURATION 300 /* 5 minutes = 300 seconds */
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#define MAX_SHORT_TEST_DURATION 3 /* 3 seconds */
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/*
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/*
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* Simple spin delay in microsecond units for device drivers.
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* Simple spin delay in microsecond units for device drivers.
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* This is very dependent on the clock speed of the target.
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* This is very dependent on the clock speed of the target.
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@@ -1,3 +1,9 @@
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2007-03-10 Joel Sherrill <joel@OARcorp.com>
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PR 1227/bsps
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* include/bsp.h: Remove MAX_LONG_TEST_DURATION and
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MAX_SHORT_TEST_DURATION. They are obsolete and unused.
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2006-12-02 Ralf Corsépius <ralf.corsepius@rtems.org>
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2006-12-02 Ralf Corsépius <ralf.corsepius@rtems.org>
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* configure.ac: New BUG-REPORT address.
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* configure.ac: New BUG-REPORT address.
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@@ -33,17 +33,6 @@ extern int rtems_fec_driver_attach (struct rtems_bsdnet_ifconfig *config, int at
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/* define which port the console should use - all other ports are then defined as general purpose */
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/* define which port the console should use - all other ports are then defined as general purpose */
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#define CONSOLE_PORT 0
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#define CONSOLE_PORT 0
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/*
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* Define the time limits for RTEMS Test Suite test durations.
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* Long test and short test duration limits are provided. These
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* values are in seconds and need to be converted to ticks for the
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* application.
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*
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*/
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#define MAX_LONG_TEST_DURATION 300 /* 5 minutes = 300 seconds */
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#define MAX_SHORT_TEST_DURATION 3 /* 3 seconds */
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/* externals */
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/* externals */
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/* constants */
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/* constants */
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@@ -1,3 +1,9 @@
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2007-03-10 Joel Sherrill <joel@OARcorp.com>
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PR 1227/bsps
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* include/bsp.h: Remove MAX_LONG_TEST_DURATION and
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MAX_SHORT_TEST_DURATION. They are obsolete and unused.
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2006-12-02 Ralf Corsépius <ralf.corsepius@rtems.org>
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2006-12-02 Ralf Corsépius <ralf.corsepius@rtems.org>
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* configure.ac: New BUG-REPORT address.
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* configure.ac: New BUG-REPORT address.
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@@ -130,17 +130,6 @@ extern int rtems_enet_driver_attach (struct rtems_bsdnet_ifconfig *config);
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/* System frequency */
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/* System frequency */
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#define BSP_SYSTEM_FREQUENCY (66 * 1000 * 1000)
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#define BSP_SYSTEM_FREQUENCY (66 * 1000 * 1000)
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/*
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* Define the time limits for RTEMS Test Suite test durations.
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* Long test and short test duration limits are provided. These
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* values are in seconds and need to be converted to ticks for the
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* application.
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*
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*/
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#define MAX_LONG_TEST_DURATION 300 /* 5 minutes = 300 seconds */
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#define MAX_SHORT_TEST_DURATION 3 /* 3 seconds */
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/*
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/*
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* Simple spin delay in microsecond units for device drivers.
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* Simple spin delay in microsecond units for device drivers.
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* This is very dependent on the clock speed of the target.
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* This is very dependent on the clock speed of the target.
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@@ -1,3 +1,9 @@
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2007-03-10 Joel Sherrill <joel@OARcorp.com>
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PR 1227/bsps
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* include/bsp.h: Remove MAX_LONG_TEST_DURATION and
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MAX_SHORT_TEST_DURATION. They are obsolete and unused.
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2006-12-02 Ralf Corsépius <ralf.corsepius@rtems.org>
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2006-12-02 Ralf Corsépius <ralf.corsepius@rtems.org>
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* configure.ac: New BUG-REPORT address.
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* configure.ac: New BUG-REPORT address.
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@@ -33,17 +33,6 @@ extern int rtems_fec_driver_attach (struct rtems_bsdnet_ifconfig *config, int at
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/* define which port the console should use - all other ports are then defined as general purpose */
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/* define which port the console should use - all other ports are then defined as general purpose */
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#define CONSOLE_PORT 0
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#define CONSOLE_PORT 0
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/*
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* Define the time limits for RTEMS Test Suite test durations.
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* Long test and short test duration limits are provided. These
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* values are in seconds and need to be converted to ticks for the
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* application.
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*
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*/
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#define MAX_LONG_TEST_DURATION 300 /* 5 minutes = 300 seconds */
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#define MAX_SHORT_TEST_DURATION 3 /* 3 seconds */
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/* externals */
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/* externals */
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/* constants */
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/* constants */
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@@ -1,3 +1,9 @@
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2007-03-10 Joel Sherrill <joel@OARcorp.com>
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PR 1227/bsps
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* include/bsp.h: Remove MAX_LONG_TEST_DURATION and
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MAX_SHORT_TEST_DURATION. They are obsolete and unused.
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2007-02-08 Eric Norum <norume@aps.anl.gov>
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2007-02-08 Eric Norum <norume@aps.anl.gov>
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* startup/bspstart.c: Fixed FPGA interrupt handling.
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* startup/bspstart.c: Fixed FPGA interrupt handling.
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@@ -50,17 +50,6 @@ extern int rtems_fec_driver_attach (struct rtems_bsdnet_ifconfig *config, int at
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/* define which port the console should use - all other ports are then defined as general purpose */
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/* define which port the console should use - all other ports are then defined as general purpose */
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#define CONSOLE_PORT 0
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#define CONSOLE_PORT 0
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/*
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* Define the time limits for RTEMS Test Suite test durations.
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* Long test and short test duration limits are provided. These
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* values are in seconds and need to be converted to ticks for the
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* application.
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*
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*/
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#define MAX_LONG_TEST_DURATION 300 /* 5 minutes = 300 seconds */
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#define MAX_SHORT_TEST_DURATION 3 /* 3 seconds */
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/* externals */
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/* externals */
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/* constants */
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/* constants */
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@@ -1,3 +1,9 @@
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2007-03-10 Joel Sherrill <joel@OARcorp.com>
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PR 1227/bsps
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* include/bsp.h: Remove MAX_LONG_TEST_DURATION and
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MAX_SHORT_TEST_DURATION. They are obsolete and unused.
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2006-12-02 Ralf Corsépius <ralf.corsepius@rtems.org>
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2006-12-02 Ralf Corsépius <ralf.corsepius@rtems.org>
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* configure.ac: New BUG-REPORT address.
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* configure.ac: New BUG-REPORT address.
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@@ -28,17 +28,6 @@ extern "C" {
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#include <rtems/clockdrv.h>
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#include <rtems/clockdrv.h>
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#include <libcpu/au1x00.h>
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#include <libcpu/au1x00.h>
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/*
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* Define the time limits for RTEMS Test Suite test durations.
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* Long test and short test duration limits are provided. These
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* values are in seconds and need to be converted to ticks for the
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* application.
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*
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*/
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#define MAX_LONG_TEST_DURATION 300 /* 5 minutes = 300 seconds */
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#define MAX_SHORT_TEST_DURATION 3 /* 3 seconds */
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/*
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/*
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* Define the interrupt mechanism for Time Test 27
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* Define the interrupt mechanism for Time Test 27
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*/
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*/
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@@ -1,3 +1,9 @@
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2007-03-10 Joel Sherrill <joel@OARcorp.com>
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PR 1227/bsps
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* include/bsp.h: Remove MAX_LONG_TEST_DURATION and
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MAX_SHORT_TEST_DURATION. They are obsolete and unused.
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2006-12-02 Ralf Corsépius <ralf.corsepius@rtems.org>
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2006-12-02 Ralf Corsépius <ralf.corsepius@rtems.org>
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* configure.ac: New BUG-REPORT address.
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* configure.ac: New BUG-REPORT address.
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@@ -40,17 +40,6 @@ extern "C" {
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extern void WriteDisplay( char * string );
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extern void WriteDisplay( char * string );
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/*
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* Define the time limits for RTEMS Test Suite test durations.
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* Long test and short test duration limits are provided. These
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* values are in seconds and need to be converted to ticks for the
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* application.
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*
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*/
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#define MAX_LONG_TEST_DURATION 300 /* 5 minutes = 300 seconds */
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#define MAX_SHORT_TEST_DURATION 3 /* 3 seconds */
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/*
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/*
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* Stuff for Time Test 27
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* Stuff for Time Test 27
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*/
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*/
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@@ -1,3 +1,9 @@
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2007-03-10 Joel Sherrill <joel@OARcorp.com>
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PR 1227/bsps
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* include/bsp.h: Remove MAX_LONG_TEST_DURATION and
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MAX_SHORT_TEST_DURATION. They are obsolete and unused.
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2006-12-02 Ralf Corsépius <ralf.corsepius@rtems.org>
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2006-12-02 Ralf Corsépius <ralf.corsepius@rtems.org>
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* configure.ac: New BUG-REPORT address.
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* configure.ac: New BUG-REPORT address.
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@@ -27,17 +27,6 @@ extern "C" {
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#include <rtems/clockdrv.h>
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#include <rtems/clockdrv.h>
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#include <libcpu/tx4925.h>
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#include <libcpu/tx4925.h>
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/*
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* Define the time limits for RTEMS Test Suite test durations.
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* Long test and short test duration limits are provided. These
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* values are in seconds and need to be converted to ticks for the
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* application.
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*
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*/
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#define MAX_LONG_TEST_DURATION 300 /* 5 minutes = 300 seconds */
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#define MAX_SHORT_TEST_DURATION 3 /* 3 seconds */
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/*
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/*
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* Define the interrupt mechanism for Time Test 27
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* Define the interrupt mechanism for Time Test 27
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*
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*
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@@ -1,3 +1,9 @@
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2007-03-10 Joel Sherrill <joel@OARcorp.com>
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PR 1227/bsps
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* include/bsp.h: Remove MAX_LONG_TEST_DURATION and
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MAX_SHORT_TEST_DURATION. They are obsolete and unused.
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2006-12-02 Ralf Corsépius <ralf.corsepius@rtems.org>
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2006-12-02 Ralf Corsépius <ralf.corsepius@rtems.org>
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* configure.ac: New BUG-REPORT address.
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* configure.ac: New BUG-REPORT address.
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@@ -27,17 +27,6 @@ extern "C" {
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#include <rtems/clockdrv.h>
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#include <rtems/clockdrv.h>
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#include <libcpu/tx4938.h>
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#include <libcpu/tx4938.h>
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/*
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* Define the time limits for RTEMS Test Suite test durations.
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* Long test and short test duration limits are provided. These
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* values are in seconds and need to be converted to ticks for the
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* application.
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*
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*/
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#define MAX_LONG_TEST_DURATION 300 /* 5 minutes = 300 seconds */
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#define MAX_SHORT_TEST_DURATION 3 /* 3 seconds */
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/*
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/*
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* Define the interrupt mechanism for Time Test 27
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* Define the interrupt mechanism for Time Test 27
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*
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*
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Reference in New Issue
Block a user